Polarization in pseudocubic epitaxial relaxed PMN-PT thin films
نویسندگان
چکیده
Understanding the relationship between structural characteristics and functional properties of complex relaxor ferroelectric thin films is high interest for designing materials with performances. In this work, structure epitaxial relaxed pulsed-laser-deposited Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT; x = 25, 33, 40) on LaNiO3/SrTiO3 substrates analyzed using a variety diffraction spectroscopic techniques. While based data obtained from high-resolution x-ray scanning transmission electron microscopy analysis, average PMN-xPT metrically cubic, micro-Raman polarimetry measurements indicate tetragonal-like phase marked preference polarization perpendicular to film all three compositions. The results Raman scattering analysis are supported by electromechanical samples, which clearly show that have locally non-centrosymmetric structure. Furthermore, only gradual enhancement electrical PMN-25PT PMN-40PT observed, attributed small tetragonal distortions highly similar
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2022
ISSN: ['1520-8842', '0003-6951', '1077-3118']
DOI: https://doi.org/10.1063/5.0067531